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BestsellerE-Book
Author Wang, Jing, author.

Title Data-driven fault detection and reasoning for industrial monitoring / Jing Wang, Jinglin Zhou, Xiaolu Chen.

Publication Info. Singapore : Springer, [2022]
©2022

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Location Call No. Status
 University of Saint Joseph: Pope Pius XII Library - Internet  WORLD WIDE WEB E-BOOK Springer    Downloadable
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Description 1 online resource (277 pages) : illustrations (chiefly color).
text file PDF rda
Series Intelligent control and learning systems ; volume 3
Intelligent control and learning systems ; volume 3.
Access Open access GW5XE
Bibliography Includes bibliographical references.
Summary This open access book assesses the potential of data-driven methods in industrial process monitoring engineering. The process modeling, fault detection, classification, isolation, and reasoning are studied in detail. These methods can be used to improve the safety and reliability of industrial processes. Fault diagnosis, including fault detection and reasoning, has attracted engineers and scientists from various fields such as control, machinery, mathematics, and automation engineering. Combining the diagnosis algorithms and application cases, this book establishes a basic framework for this topic and implements various statistical analysis methods for process monitoring. This book is intended for senior undergraduate and graduate students who are interested in fault diagnosis technology, researchers investigating automation and industrial security, professional practitioners and engineers working on engineering modeling and data processing applications.
Contents Introduction -- Basic Statistical Fault Detection Problems -- Principal Component Analysis -- Canonical Variate Analysis -- Partial Least Squares Regression -- Fisher Discriminant Analysis -- Canonical Variate Analysis -- Fault Classification based on Local Linear Embedding -- Fault Classification based on Fisher Discriminant Analysis -- Quality-Related Global-Local Partial Least Square Projection Monitoring -- Locality-Preserving Partial Least-Squares Statistical Quality Monitoring -- Locally Linear Embedding Orthogonal Projection to Latent Structure (LLEPLS) -- Bayesian Causal Network for Discrete Systems -- Probability Causal Network for Continuous Systems -- Dual Robustness Projection to Latent Structure Method based on the L_1 Norm.
Note Description based upon print version of record.
Local Note Springer Nature Springer Nature Open Access eBooks
Subject Industrial engineering -- Data processing.
Fault location (Engineering) -- Data processing.
Fault location (Engineering) -- Data processing. (OCoLC)fst00921984
Industrial engineering -- Data processing. (OCoLC)fst00970996
Genre/Form Electronic books.
Added Author Zhou, Jinglin, author.
Chen, Xiaolu, author.
Other Form: Print version: Wang, Jing Data-Driven Fault Detection and Reasoning for Industrial Monitoring Singapore : Springer Singapore Pte. Limited,c2022 9789811680434
ISBN 9789811680441 (electronic book)
9811680442 (electronic book)
9789811680434
9811680434
Standard No. 10.1007/978-981-16-8044-1 doi
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